| WU Fa-lin,ZHANG Tian-cai,WANG Yong-feng,DENG Xian-ming,TANG Ji-hai,LIN Mu-chun,SUN Kuan,ZHANG Lin,NI Shi-wen,WU Xin-rui.Highly Conductive and Flexible Poly (3,4-Ethylenedioxythiophene)/Poly (Styrene Sulfonate) Film and Investigation of the Effects of Doping[J],52(12):440-448 |
| Highly Conductive and Flexible Poly (3,4-Ethylenedioxythiophene)/Poly (Styrene Sulfonate) Film and Investigation of the Effects of Doping |
| Received:November 23, 2022 Revised:March 13, 2023 |
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| DOI：10.16490/j.cnki.issn.1001-3660.2023.12.038 |
| KeyWord:PEDOT:PSS inorganic acid film conductivity figure of merit |
| Author | Institution |
| WU Fa-lin |
Key Laboratory of Low-grade Energy Utilization Technologies and Systems, Ministry of Education, Chongqing University, Chongqing , China;Southwest Institute of Technology and Engineering, Chongqing , China |
| ZHANG Tian-cai |
Southwest Institute of Technology and Engineering, Chongqing , China |
| WANG Yong-feng |
Southwest Institute of Technology and Engineering, Chongqing , China |
| DENG Xian-ming |
Southwest Institute of Technology and Engineering, Chongqing , China |
| TANG Ji-hai |
Southwest Institute of Technology and Engineering, Chongqing , China |
| LIN Mu-chun |
Southwest Institute of Technology and Engineering, Chongqing , China |
| SUN Kuan |
Key Laboratory of Low-grade Energy Utilization Technologies and Systems, Ministry of Education, Chongqing University, Chongqing , China |
| ZHANG Lin |
School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai , China |
| NI Shi-wen |
Chongqing Jianshe Yamaha Motorcycle Company Limited, Chongqing , China |
| WU Xin-rui |
Southwest Institute of Technology and Engineering, Chongqing , China |
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| Abstract: |
| Poly (3,4-ethylenedioxythiophene)/poly (styrene sulfonate) (PEDOT:PSS) is a new conductive film material. In order to improve the physical properties of the film, an effective secondary doping method is adopted. The conductivity of PEDOT:PSS film was improved by secondary doping with various inorganic acids. The physical properties of doped film were tested and analyzed by four point probe method and UV spectrophotometer. Atomic force microscope (AFM) was used to measure the surface morphology of the film. The internal structure of the film was analyzed by X-ray photoelectron spectroscopy (XPS) and Hall effect testing system. |
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