| LI Jiong,LIN Wei-xuan,CHENG He-deng,CHEN Rong-jie,WANG Jiang-yong.Characterization of the Surface Morphologies Generated from Non-Gaussian Height Distribution Functions[J],45(6):205-212 |
| Characterization of the Surface Morphologies Generated from Non-Gaussian Height Distribution Functions |
| Received:January 22, 2016 Revised:June 20, 2016 |
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| DOI：10.16490/j.cnki.issn.1001-3660.2016.06.031 |
| KeyWord:height distribution function surface morphology morphology characterization amplitude roughness parameters roughness parameter simplification random distribution |
| Author | Institution |
| LI Jiong |
College of Science, Shantou University, Shantou , China |
| LIN Wei-xuan |
College of Science, Shantou University, Shantou , China |
| CHENG He-deng |
College of Science, Shantou University, Shantou , China |
| CHEN Rong-jie |
College of Science, Shantou University, Shantou , China |
| WANG Jiang-yong |
College of Science, Shantou University, Shantou , China |
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| Abstract: |
| Objective To study the change of the roughness parameters with the surface morphologies having different height distribution functions. Methods Height distribution function (HDF) contains the height information of a surface morphology that can be reconstructed through the inverse operation of the HDF. In this paper, we calculated the amplitude roughness parameters used to characterize the different surface morphologies generated by different HDFs. Results By analyzing the correlation of these calculated parameters, it showed that some of the parameters (Ra, Rq, Rsk, Rku) may change correlatively with the shape of the HDFs. Based on the simulation results, a criterion for selecting the suitable amplitude parameters was presented. Conclusion According to the requirements, some suitable roughness parameters could be chosen for characterization of surface morphology. If the surface morphologies had the same height distribution function, they could be characterized by the parameters related either to the surface peek and valley (such as Rp, Rv) or to the height information (such as Rtm, R3y). If the surface morphologies had different height distribution functions, they could be simply distinguished by the parameters determined by the height distribution function (such as Ra, Rq, Rsk, Rku), and then the other parameters could be measured according to the requirements. |
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